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报告信息
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2017年10月19日学术报告
2017-10-19      来源:江南大学物联网工程学院
报告题目(Title): Electrostatic Discharge (ESD) Protection for RF/High-Speed Integrated Circuits: Challenges and Solutions
报告人姓名(Speaker): Juin J. Liou
时间(Date&Time): 9:30am, Oct. 19th, 2017
地点(Location): Room B222, School of IoT
报告摘要(Abstract): The continuing scaling of CMOS technology makes the ESD-induced failures even more prominent, and one can predict with certainty that the availability of effective and robust ESD protection solutions will become a critical and essential factor to the successful advancement and commercialization of the next-generation CMOS-based electronics.
The development of RF electronics went almost unnoticed until early 1980’s because, unlike Si VLSI, there were no mass consumer markets for such applications. Recently, this has been changed drastically due to the explosive growth in the civil wireless communications and internets. The modern RF integrated circuits are typically operated in a voltage range of 2-4 V. This relatively low-voltage operation, together with the low tolerance of parasitic capacitance at the I/O pins and the continuing scaling in CMOS process, imposes certain challenges to the design and optimization of RF ESD protection solutions.    
An overview on the ESD sources, models, protection schemes, and testing will first be given in this talk. This is followed by presenting the recent advancement on ESD protection solutions for modern low-voltage RF integrated circuits as well as the exploration and evaluation of ESD protection solutions in sub-28nm CMOS technologies.
报告人简介(Biography): Juin J. Liou received the B.S. (honors), M.S., and Ph.D. degrees in electrical engineering from the University of Florida, Gainesville, in 1982, 1983, and 1987, respectively.
Dr. Liou holds 12 patents (1 more filed and pending), and has published 13 books (1 more in press), more than 290 journal papers (including 21 invited review articles), and more than 240 papers (including more than 110 keynote and invited papers) in international and national conference proceedings. He has been awarded more than $14.0 million of research contracts and grants from federal agencies (i.e., NSF, DARPA, Navy, Air Force, NASA, NIST), state government, and industries(i.e., Semiconductor Research Corp., Intel Corp., Intersil Corp., Lucent Technologies).
Dr. Liou received ten different awards on excellence in teaching and research from the University of Central Florida (UCF) and six different awards from the IEEE. His other honors are Fellow of IEEE, Fellow of IET, Fellow of Singapore Institute of Manufacturing Technology, Fellow of UCF-Analog Devices, Distinguished Lecturer of IEEE Electron Device Society (EDS), and Distinguished Lecturer of National Science Council. 
Dr. Liou holds several honorary professorships, including the Chang Jiang Scholar Endowed Professor of Ministry of Education, China – the highest honorary professorship in China, NSVL Distinguished Professor of National Semiconductor Corp., USA, International Honorary Chair Professor of National Taipei University of Technology. Taiwan, Honorary Endowed Professor of National Taiwan University of Science and Technology, Taiwan, Chang Gung Endowed Professor of Chang Gung University, Taiwan, Feng Chia Chair Professor of Feng Chia University, Taiwan, Chunhui Eminent Scholar of Peking University, China, Cao Guang-Biao Endowed Professor of Zhejiang University, China, Honorary Professor of Xidian University, China, Consultant Professor of Huazhong University of Science and Technology, China, and Courtesy Professor of Shanghai Jiao Tong University, China. Dr. Liou was a recipient of U.S. Air Force Fellowship Award and National University Singapore Fellowship Award.

邀请人: Hailian Liang